ANSI/ESD SP5.5.2: Electrostatic Discharge Sensitivity Testing - Very Fast Transm

This document pertains to Very Fast Transmission Line Pulse (VF-TLP) testing techniques of semiconductor components.  It establishes guidelines and standard practices presently used by development, research, and reliability engineers in both universities and industry for VF-TLP testing.  This document explains a methodology for both testing and reporting information associated with VF-TLP testing.